MOSFETScaling to Sub-Micron Range; Annalysis of Characteristic Curves in Relation to Device Parameters

dc.contributor.author	Yegon, G. K.
dc.contributor.author	Aruse, G. K.
dc.contributor.author	Koech, R. K
dc.date.accessioned	2020-03-05T09:30:04Z
dc.date.available	2020-03-05T09:30:04Z
dc.date.issued	2015-05-05
dc.identifier.issn	2250-2459
dc.identifier.uri	http://ir.mu.ac.ke:8080/jspui/handle/123456789/2879
dc.language.iso	en	en_US
dc.subject	MOSFET,	en_US
dc.subject	hort channel effects	en_US
dc.subject	velocity overshot	en_US
dc.subject	DIB	en_US
dc.subject	CMOS	en_US
dc.title	MOSFETScaling to Sub-Micron Range; Annalysis of Characteristic Curves in Relation to Device Parameters	en_US
dc.type	Article	en_US