| dc.contributor.author | Koech, Richard. K. | |
| dc.contributor.author | Soboyejo, Winston O. | |
| dc.contributor.author | Bello, Abdulhakeem | |
| dc.contributor.author | Olanrewaju, Yusuf | |
| dc.contributor.author | Cromwell, Jaya | |
| dc.contributor.author | Oyelade, Omolara V. | |
| dc.contributor.author | Oyewole, Deborah O. | |
| dc.contributor.author | Adeniji, Sharafadeen A. | |
| dc.contributor.author | Oyewole, Oluwaseun K. | |
| dc.date.accessioned | 2023-06-07T13:01:41Z | |
| dc.date.available | 2023-06-07T13:01:41Z | |
| dc.date.issued | 2022 | |
| dc.identifier.uri | https://doi.org/10.1016/B978-0-12-822944-6.00035-9 | |
| dc.identifier.uri | http://ir.mu.ac.ke:8080/jspui/handle/123456789/7570 | |
| dc.description.abstract | Reliability of electronic systems that are used for applications where flexibility and stretchability are required are becoming necessary in this modern world. Since these flexible and stretchable electronic structures are designed to undergo stress-induced deformation during service condition, it is importance to understand their fatigue behavior. In this article, the underlying fatigue behavior of the flexible and stretchable structures is presented. The theories of failure phenomena that occur during fabrication and deformations of these structures are elucidated. The detailed fatigue test and analysis of the structures are then presented before exploring the failure mechanisms and their effects on optoelectronic properties. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Elsevier | en_US |
| dc.subject | Deformation | en_US |
| dc.subject | Delamination | en_US |
| dc.title | Fatigue of flexible and stretchable electronic structures | en_US |
| dc.type | Article | en_US |
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