dc.contributor.author | Yegon, G. K. | |
dc.contributor.author | Aruse, G. K. | |
dc.contributor.author | Koech, R. K | |
dc.date.accessioned | 2020-03-05T09:30:04Z | |
dc.date.available | 2020-03-05T09:30:04Z | |
dc.date.issued | 2015-05-05 | |
dc.identifier.issn | 2250-2459 | |
dc.identifier.uri | http://ir.mu.ac.ke:8080/jspui/handle/123456789/2879 | |
dc.language.iso | en | en_US |
dc.subject | MOSFET, | en_US |
dc.subject | hort channel effects | en_US |
dc.subject | velocity overshot | en_US |
dc.subject | DIB | en_US |
dc.subject | CMOS | en_US |
dc.title | MOSFETScaling to Sub-Micron Range; Annalysis of Characteristic Curves in Relation to Device Parameters | en_US |
dc.type | Article | en_US |