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MOSFETScaling to Sub-Micron Range; Annalysis of Characteristic Curves in Relation to Device Parameters

MOSFETScaling to Sub-Micron Range; Annalysis of Characteristic Curves in Relation to Device Parameters

Yegon, G. K.; Aruse, G. K.; Koech, R. K
URI: http://ir.mu.ac.ke:8080/jspui/handle/123456789/2879
Date: 2015-05-05

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