Please use this identifier to cite or link to this item:
http://ir.mu.ac.ke:8080/jspui/handle/123456789/2879
Title: | MOSFETScaling to Sub-Micron Range; Annalysis of Characteristic Curves in Relation to Device Parameters |
Authors: | Yegon, G. K. Aruse, G. K. Koech, R. K |
Keywords: | MOSFET, hort channel effects velocity overshot DIB CMOS |
Issue Date: | 5-May-2015 |
URI: | http://ir.mu.ac.ke:8080/jspui/handle/123456789/2879 |
ISSN: | 2250-2459 |
Appears in Collections: | School of Biological and Physical Sciences |
Files in This Item:
File | Description | Size | Format | |
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G. K. Yegon,G. K. Arusei2, R. K. Koech.pdf | 757.32 kB | Adobe PDF | View/Open |
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