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Please use this identifier to cite or link to this item: http://ir.mu.ac.ke:8080/jspui/handle/123456789/2879
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dc.contributor.authorYegon, G. K.-
dc.contributor.authorAruse, G. K.-
dc.contributor.authorKoech, R. K-
dc.date.accessioned2020-03-05T09:30:04Z-
dc.date.available2020-03-05T09:30:04Z-
dc.date.issued2015-05-05-
dc.identifier.issn2250-2459-
dc.identifier.urihttp://ir.mu.ac.ke:8080/jspui/handle/123456789/2879-
dc.language.isoenen_US
dc.subjectMOSFET,en_US
dc.subjecthort channel effectsen_US
dc.subjectvelocity overshoten_US
dc.subjectDIBen_US
dc.subjectCMOSen_US
dc.titleMOSFETScaling to Sub-Micron Range; Annalysis of Characteristic Curves in Relation to Device Parametersen_US
dc.typeArticleen_US
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