Please use this identifier to cite or link to this item: http://ir.mu.ac.ke:8080/jspui/handle/123456789/2879
Title: MOSFETScaling to Sub-Micron Range; Annalysis of Characteristic Curves in Relation to Device Parameters
Authors: Yegon, G. K.
Aruse, G. K.
Koech, R. K
Keywords: MOSFET,
hort channel effects
velocity overshot
DIB
CMOS
Issue Date: 5-May-2015
URI: http://ir.mu.ac.ke:8080/jspui/handle/123456789/2879
ISSN: 2250-2459
Appears in Collections:School of Biological and Physical Sciences

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